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Principles of Astrometry : With special emphasis on long-focus photographic astrometry / Peter Van de Kamp

By: Van de Kamp, Peter.
Material type: materialTypeLabelBookSeries: A Series of Books in Mathematics.Publisher: San Francisco : Freeman W.H. and company, 1967Description: vii, 227 p. : il. ; 25 cm.Subject(s): Astrometría
Contents:
Spherical Astrometry - Plane Astrometry - Analysis of Observations
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Item type Current location Call number Status Date due Item holds
Libros Libros OAC
Depósito Bosque Alegre
95.10.jk VAN Available
Libros Libros OAC
Colección general
95.10.JK VAN Available
Total holds: 0

Spherical Astrometry - Plane Astrometry - Analysis of Observations

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